CMI900: is a robust, cost effective, and high performance X-ray fluorescence (XRF) analyser for measurement of coating thickness and material composition.

Specifications

X-ray excitation : 50 W (50kV and 1mA) micro-focused W anode tube
Detector: Xe filled proportional counter with secondary filtering
Digital Pulse Processing: 4096 CH digital multi-channel analyzer
Automatic signal processing including dead time correction and pulse pile up rejection
Computer:Pentium D, 3.0 GHz, 160 Gb HD, 512Mb RAM with MicrosoftTM XP **equivalent or better
Power Supply: 85~130 or 215~265 volts, with frequency range of 47Hz to 63Hz
Working Environment: 50°F (10°C) to 104°F (40°C) and up to 98% RH, non-condensing
Table Travel (XYZ programmable) 6” X 7” x 1.9” (15.2cm X 17.8cm X 4.8cm)

Benefits CMI-900

• Multi-layer metallic coating thickness measurement
• Alloy identification
• Composition analysis of up to 15 elements simultaneously
• Plating solution analysis
• Rapid, non-destructive gold karat assay
• 3 instrument configurations to accommodate various sample sizes
• Over 3000 CMI900 series instruments sold worldwide